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Pb1-x LaxTiO3薄膜的制备及特性研究
Investigation on Characters and Preparation of Pb1-xLaxTiO3 (PLT) Thin Films
【摘要】 用溶胶-凝胶法在Pt/Ti/StO2/Si(100)基底上制备Pb1-xLaxTiO3(PLT,x≤0.2)薄膜,研究薄膜的结构及其介电、电性质铁电性能。在600℃ 下退火1h的PLT薄膜表现出单一的钙钛矿结构,(100)择优取向明显。在室温下PLT薄膜有典型的电滞回线。在x≤0.2(摩尔比)的范围内,PLT薄膜的矫顽场、剩余极化强度和随着La的增加而降低,相对介电常数则随着La的增加而增加。
【Abstract】 Pb1-xLaxTiO3 (PLT) thin films were fabricated by sol-gel spin on process onto Pt/Ti/Sio2/Si(100) substrates. We had investigated the crystal structure, dielectric and ferroelectric properties of PLT thin films according to lamthanum doping concentration. The films annealed at 600℃ for 1h had the single perovskite phase and preferential (100) orientation. The PLT films showed the typical polarization-electric field hysteresis loops. The coercive field and remnant polarization decreased with increasing La concentration. The effective dielectric constant increased according to the increase of La content.
- 【文献出处】 功能材料 ,Journal of Functional Materials , 编辑部邮箱 ,2001年02期
- 【分类号】TB43
- 【被引频次】1
- 【下载频次】69