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非晶硅薄膜的镍诱导横向晶化工艺及其特性

Ni- Induced Lateral Crystallization of Amorphous Silicon Thin Films and Its Characterization

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【作者】 秦明; VincentM.C.Poon;

【Author】 QIN Ming1and Vincent M.C.Poon2 ( 1Microelectronics Center,Southeast University,N anjing 2 10 0 96 ,China) ( 2 Departmentof Electrical and Electronic Engineering,H ong K ong University of Science and Technology,Kowloon,H ong K ong,China)

【机构】 东南大学微电子中心!南京210096; 香港科技大学电子与电机工程系!香港;

【摘要】 报道了镍诱导非晶硅薄膜的晶化技术 ,探讨了镍诱导晶化机理 .详细调查了诱导晶化时间和温度对晶化速率的影响 ,并用 Raman、AFM和 TEM等测试了材料的特性 .实验结果发现用该方法可以获得较大晶粒的多晶 ;在晶化温度为 6 2 5℃左右时晶体横向晶化速率最高 .如要获得较长的晶体 ,低温退火则比较有利

【Abstract】 Ni- induced lateral crystallization of amorphous silicon thin films has been proposed.Its m echanism has also been dis- cussed.The effect of annealing temperature and tim e on the Metal Induced L ateral Characterization( MIL C) rate has been in- vestigated in detail.The film was characterized by Ram an,AFM and TEM etc.The experimental results show thatlarge grains are easily achieved by MIL C.The highest MIL C rate was obtained at the annealing temperature of about6 2 5℃ ,while longer MIL C film was more easily achieved at lower tem perature.

【关键词】 镍; 非晶硅; 晶化;
【Key words】 nickel; am orphous silicon; crystallization;
  • 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,2001年01期
  • 【分类号】TN305
  • 【被引频次】7
  • 【下载频次】104
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