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非晶硅薄膜的镍诱导横向晶化工艺及其特性
Ni- Induced Lateral Crystallization of Amorphous Silicon Thin Films and Its Characterization
【摘要】 报道了镍诱导非晶硅薄膜的晶化技术 ,探讨了镍诱导晶化机理 .详细调查了诱导晶化时间和温度对晶化速率的影响 ,并用 Raman、AFM和 TEM等测试了材料的特性 .实验结果发现用该方法可以获得较大晶粒的多晶 ;在晶化温度为 6 2 5℃左右时晶体横向晶化速率最高 .如要获得较长的晶体 ,低温退火则比较有利
【Abstract】 Ni- induced lateral crystallization of amorphous silicon thin films has been proposed.Its m echanism has also been dis- cussed.The effect of annealing temperature and tim e on the Metal Induced L ateral Characterization( MIL C) rate has been in- vestigated in detail.The film was characterized by Ram an,AFM and TEM etc.The experimental results show thatlarge grains are easily achieved by MIL C.The highest MIL C rate was obtained at the annealing temperature of about6 2 5℃ ,while longer MIL C film was more easily achieved at lower tem perature.
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,2001年01期
- 【分类号】TN305
- 【被引频次】7
- 【下载频次】104