【摘要】 本文报道利用光学显微法和同步辐射白光 X射线形貌术对非线性光学晶体 LBO缺陷的研究结果。利用光学显微法观测 ,得到多个面不同形态的位错蚀坑和小角度晶界 ;利用同步辐射白光 X射线形貌术拍摄出晶体薄片的形貌照片 ,观测到密集的位错以及包裹物的衍射花样。文中研究并指出这些缺陷产生的原因更多还原

【Abstract】 The defects of LBO crystal have been studied by optical micrography and White beam synchrotron radiation topography In optical micrography the etchpits of dislocation and the low angle grain boundaries were observed on several planes The X ray topographic photographs have been taken on crystal slices,dense dislocation and diffraction design of inclusion have been shown by synchrotron radiation topography The reasons of the defects have been studied and indicated更多还原