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X射线荧光分析中谢尔曼方程逆问题的求解(理论影响系数法和基本参数法)
Solution of Inverse Problem of Therman Equation in Quantitative X-ray Fluorescence Analysis
【摘要】 本文首先在理论分析基础上 ,建立多元素样品的重量分数 Ci、X射线荧光相对强度 Ri 与基体效应因子 Fi 的代数关系。然后 ,按照此关系导出两种求解谢尔曼方程逆问题的方法 ,即理论影响系数法和基本参数法。并用这两种方法分析了 6个耐热钢标样 ,主量、常量元素的平均相对分析误差 <0 .5 %,对低含量轻元素Si、P、 S的分析也取得良好的结果
【Abstract】 In this paper,firstly the algorithmic relation b etween the weight fraction C i,X-ray fluorescence relative intensity R i and matrix effect factor F i is created for the multi-element specimen on theoretical basis.Secondly,according to this algorithm relation,the typical method to solve inverse problem of Therman equation can be developed that is the theoretical influence coefficience method and the fundamental parameter method. Six standards are analysed by these two methods respectively,and results are goo d agree with the certified values.
【Key words】 X-ray fluorescence analysis; Iteration method; Influence coefficient method; Fundamental parameter method;
- 【文献出处】 光谱学与光谱分析 ,SPECTROSCOPY AND SPECTRAL ANALYSIS , 编辑部邮箱 ,2000年03期
- 【分类号】O657.34
- 【被引频次】8
- 【下载频次】158