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具有穿通基区的双极晶体管光探测器的噪声特性研究
Noise characteristics of Si phototransistor with a punchthrough base
【摘要】 提出了一种具有穿通基区的Si双极晶体管光探测器。通过优化器件结构参数,使基区在工作时完全耗尽,从而得到大的光增益和小的噪声电流。实验测光电转换增益大于150,000;器件具有良好的噪声特性,噪声功率与器件的直流偏置电流成正比,即in2=2qIcΔf。
【Abstract】 Novel Si phototransistors with a punchthrough base have been fabricated with regular planar technology. High gain and low noise have been achieved in this kind of device due to the fully depletion of base. The optical conversion gains larger than 150,000 have been observed when incident light power is 0.1nW . In addition to very high gain, the unique structure of the device also results in low output noise. The measured output noises at different currents well fit the wellknown relation in2=2qIcΔ f .
【关键词】 光电晶体管;
光探测器;
穿通基区;
噪声;
双极晶体管;
【Key words】 Phototransistor; Photodetector; Punchthorugh base; Noise, Bipolar transistor;
【Key words】 Phototransistor; Photodetector; Punchthorugh base; Noise, Bipolar transistor;
- 【文献出处】 功能材料与器件学报 ,JOURNAL OF FUNCTIONAL MATERIALS AND DEVICES , 编辑部邮箱 ,2000年03期
- 【分类号】TN364
- 【下载频次】68