【摘要】 扫描隧道显微镜(SEM)和原子力显微镜(AFM)具有原子级的极高分辨率,可在纳米尺度上获得实空间的表面微观三维形貌,且可定量表征,因此可用来研究材料断裂与疲劳的微观机理。简要介绍STM和AFM在该领域的应用及所取得的若干进展。更多还原

【Abstract】 Scanning tunnel microscope (STM) and atomic force microscope (AFM) allows topographic imaging of surfaces in real space with resolution down to the atom scale,and can provide quantitative information Therefore they can be used to invertigate fracture and fatigue of materials on the nano meter scale. The applications of STM and AFM in the study of fracture and fatigue are reviewed in this paper.更多还原