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直接光CVD类金刚石碳膜的初期成膜结构
The structure of initial DLC films prepared by direct photo chemical vapor deposition technique
【摘要】 以微波激励氙(Xe) 发射的真空紫外光(VUV) 作光源,乙炔(C2H2) 作反应气体,采用直接光化学汽相淀积(CVD) 工艺,在硅(Si) 、钼( Mo) 及玻璃衬底上,120 ℃的低温下进行了类金刚石碳(DLC) 膜的试生长。用X 射线光电子能谱(XPS) 、扫描电子显微镜(SEM) 等手段进行了初期成膜结构的测试分析。测试结果表明,在所有三种衬底上均能淀积生成DLC 膜。其中C1s 态原子的含量在69 .98 % ~74 .60 % 之间,相应的键合能为285 .0 ~285 .6 eV。淀积膜是以SP2 键结构为主的DLC膜。实验结果也表明,氧在成膜过程中是影响最大的因素。
【Abstract】 In this paper,we report the result of diamond like carbon films grown at comparatively low substrate temperature(120 ℃) on Si, Mo and glass substrates by direct photo chemical vapor deposition (CVD) technique.In the process,a microwave excited vacuum ultraviolet(VUV) Xe lamp is used as the light source and the mixture of C 2H 2 and Ar is used as reactive gases.X-ray photoelectron spectroscope (XPS) and scanning electron microscope (SEM) are used to study the growth process of primary DLC films.Their carbon atom content is from 69.98% to 74.60% with the binding energy of 285.0 eV to 285.6 eV. Our result is also shown that oxygen is the most important element affcting DLC film growth.
【Key words】 DLC films; photo chemical vapor deposition; X-ray photoelectron spectroscope; scanning electron microscope;
- 【文献出处】 半导体光电 ,SEMICONDUCTOR OPTOELECTRONICS , 编辑部邮箱 ,1999年06期
- 【分类号】TN304.055
- 【被引频次】36
- 【下载频次】94