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电容耦合三结单电子晶体管特性分析
Analysis of Capacitance Coupled Three Junction Single Electron Transistor Characteristics
【摘要】 本文基于电容耦合多个纳米隧道结串联结构的半经典模型,研究了三结单电子晶体管的基本方程,分析了其I-V特性,并对三结与两结单电子晶体管的特性进行了比较.结果表明,单电子晶体管的特性与常规晶体管有很大的差别,且三结单电子晶体管与两结单电子晶体管相比较,具有更高的灵敏度和更强的抗电磁干扰能力
【Abstract】 Abstract On the basis of semiclassical model for capacitance coupled nanometer tunneling junction array(NTJA), we study the basic equations for three junction single electron transistor (SET) and its I V characteristics, compare it with two junction SET. Our results indicate obvious differences between the characteristics of SETs and conventional transistor. Three junction SETs seem to have higher sensitivity and be able to resist stronger electromagnetic disturbance.
【基金】 国家自然科学基金
- 【文献出处】 半导体学报 ,CHINESE JOURNAL OF SEMICONDUCTORS , 编辑部邮箱 ,1998年08期
- 【分类号】TN322.07
- 【被引频次】6
- 【下载频次】56