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铅同位素比值的飞行时间二次离子质谱法测量
Measurement of Lead Isotpe by TOF-SIMS
【摘要】 介绍了用飞行时间二次离子质谱法对器物中的铅同位素比值的测量。在仔细地讨论了质量干扰、二次离子产额的同位素分馆效应等对测量结果的影响后,认为本工作无需标准样品,可以实现对样品无损的高质量分辨的二次离子质谱分析。铅同位素比值的测量精确度优于1%。
【Abstract】 Isotope ratios of Pb contained in wares were measured using Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)without any references.The facts of mass inference and isotope fraction in this measurement were discussed in detail.The precision was better than 1%.
- 【文献出处】 质谱学报 ,JOURNAL OF CHINESE MASS SPECTROMETRY SOCIETY , 编辑部邮箱 ,1996年04期
- 【分类号】O615.2
- 【被引频次】7
- 【下载频次】111