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半侧颜面发育矮小综合征X-线片测量分析
AP CEPHALOMETRIC ANALYSIS FOR HEMIFACIAL MICROSOMIA
【摘要】 用前后位 X-线头部摄片测量分析的方法对12例半侧颜面发育矮小综合征采用颅内参考中线对眶、上下颌骨进行了对称性和大小的分析。从测量结果来看,主要的畸形变化在下颌骨,特别是下颌骨的长度;眶和上颌骨的变化在两侧无明显的差异,这可能与样本量和病人的畸形类别有关。从测量结果和统计分析中可以看到各个部位的畸形变化有一定的相关性。因而在制定治疗计划中应考虑到各部分的畸形情况。
【Abstract】 In this sludy we use AP cephalomelric method analyse 12 hemifacial microsomia cases system- atically.within the study,we use reference midline to analyse the size and symmetry of the orbit,maxillar and mandible.From the results we find the main changes in the mandible,spcially in the length of the mandible. The changes in the orbit and maxillar have no significant difference,this is probably related to the sample size and classification of the paticnts.In the statistic analysis we see lhere are some relalion among the every parts,so in the treatment planning,should consider the deformities of orbit、maxillar and mandible.
【Key words】 AP cephalometric; Hemifacial; microsomia; Orbit Maxillar; Mandible;
- 【文献出处】 中国美容医学 ,Chinese Journal of Aesthetic Medicine , 编辑部邮箱 ,1996年03期
- 【分类号】R816.98
- 【下载频次】26