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电路穷尽测试的线性反馈移位寄存器系列
Exhaustive Test of Linear Feedback Shift Register Circuits
【摘要】 本文介绍了在Galois域GF(2)上线性反馈移位寄存器的链接原理,并给出了一种高级数的线性反馈移位寄存器如何由低级数线性反馈移位寄存器构成的方法,以满足对具有不同输入端数目电路测试的要求。初步的实验结果表明,从8至24级的线性反馈移位寄存器都可以由1至7级的线性反馈移位寄存器链接构成。
【Abstract】 The linking principle of linear feedback shift registers(LFSR’s)on GF(2)in Galois domain is described in the paper.To meet the test requirement,for circuits with different input ports,a technique has been developed to compose high-degree LFSR’s with lower-degree LFSR’s. Results from initial experiments show that an 8~24 degree LFSR can be formed by linking 1~7 degree LFSR’s.
【关键词】 穷尽测试;
线性反馈移位寄存器;
链接;
内建测试;
【Key words】 Exhaustive test、Linear feedback shift register; Linking; Built-in test;
【Key words】 Exhaustive test、Linear feedback shift register; Linking; Built-in test;
- 【文献出处】 微电子学 ,MICROELECTRONICS , 编辑部邮箱 ,1994年05期
- 【分类号】TP332.11
- 【下载频次】61