【摘要】 研究了烧结温度对钨镁酸铅基陶瓷Ｘ７Ｒ特性及其显微结构的影响，实验结果表明：烧结温度在９５０－９８０℃范围内，该体系电容随温度的变化率（即ＴＣＣ）满足Ｘ７Ｒ要求。显微分析可知：体系的微观结构中存在富钨和富锆的不均匀微区，温度升高，微区间均匀性增加，在１０００℃以上，各微区成份接近，但容温变化偏离Ｘ７Ｒ要求的范围。更多还原

【Abstract】 The influences of sintering- temperature on X7R characteristic and microstructure for Pb（Mg1/2W 1/2）O₃-based ceramics are investigated. The experimental results indicate that the materials showing“ X7R”characteristic in the range of 950～980℃. The analysis of the microstructure shows that there are W-richregions and Zr-rich regions in the system ,and higher sintering-tempreature would improve the homogeneityamong the regions and cause the TCC over“X7R”specification（when above 1000℃）.更多还原