节点文献
新器件寻踪
THE TRACING OF NEW DEVICES
【摘要】 由各种材料相互组合的界面中,可以探明历史上发明进程的踪迹,加深对器件工作机理的认识,并给未来新器件的开发提供方向。我们得出了 S—V—S—V—S 和 M—I—M—I—M 及 M—I—M—V—M 三端器件是极有开发价值的结论。
【Abstract】 From the analysis of arrangement of interfaces combined by elemental materials, We may find the trace of historical inventions, penetrate the cognition of work principle of device, and provide the direction of new device to be exploited in time to come, So we get the conclusion: S-V- S- V-S and M-I-M-I-M or M-I-M-V-M three terminal devices are very valuable to be exploited.
- 【文献出处】 低温与超导 ,Cryogenics and Superconductivity , 编辑部邮箱 ,1990年04期
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