【摘要】 用XPS测量了Pt/InP肖特基接触界面的芯态谱和价带谱,结合AES测量,提出了在界面形成磷化铂的实验证据.同时也测到Pt4f两自旋分裂峰强度比随光电子发射角的反常变化.更多还原

【Abstract】 The spectra of the core level and valence band at Pt/InP Schottky contact inter-face have been measured by XPS,experimental evidence of platinum phosphide for-mation at the interface has been suggested combinding AES measurement. And theanomalous change of the intensity ratio of two Pt4f spinsplitting peaks with photoele-ctron emission angle has been obtained.更多还原