CCD is widely used in many fields for its high-sensitivity. It is of great significance to study the laser-induced-effect of CCD for its vulnerability when exposed under high power sources. In this paper, disturbing effects of CCD under broadband source and 532nm CW-laser irradiation are analyzed by experimental methodology. Relevant threshold data are obtained. With result data of the experiments, the regularity between the number of saturated pixels and power density is validated by numerical fitt...