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CVD法制备的ZnO纳米线喇曼散射谱的特征
Properties of Raman Scattering of ZnO
【摘要】 要对纳米ZnO晶体进行了喇曼背散射几何配置下的喇曼测试与分析,其样品采用化学气相沉积法(CVD),分别在三种不同的温度下生长而成.在438 cm-1和1152 cm-1位置分别可以观测到纤锌矿结构的ZnO一级散射峰和二级散射峰,同时也可以看到一级散射强度与二级散射强度比的变化.结果显示:用CVD法制备纳米ZnO时,温度(即Zn蒸汽的浓度)只影响ZnO纳米线的形貌特征,而并不影响它的微观结构.
【Abstract】 In this abstract,raman test and analysis are done to ZnO crystal under raman back scattering.Nano sam-ples were grown under three different temperature conditions in CVD(Chemical Vapor Deposition) method.At spots 438 cm-1and 1 152 cm-1,not only the first order scattering peak and second order scattering peak of ZnO of Wurtzite struc-ture,but also first order and second order intensity ratio variation,were observable.Test indicates that,when growing ra-man ZnO in CVD method,temperature affects only form of ZnO nanowires,but not its microcosmic structure.
- 【文献出处】 湘潭大学自然科学学报 ,Natural Science Journal of Xiangtan University , 编辑部邮箱 ,2007年01期
- 【分类号】O484.41
- 【下载频次】233