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BN-303光刻胶前烘工艺对MEMS三维结构的影响

Effect of Soft-baking of BN-303 Photo-resist on 3D Structure of MEMS in Micro-fabrication

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【作者】 蒋玉荣何永李志伟周建欧阳世翕

【Author】 JIANG Yu-rong,HE Yong,LI Zhi-wei,ZHOU Jian,OUYANG Shi-xi(State Key Laboratory of Advanced Technology for Materials Synthesis and Processing,Wuhan University of Technology,Wuhan 430070,China)

【机构】 武汉理工大学材料复合新技术国家重点实验室武汉理工大学材料复合新技术国家重点实验室 武汉430070武汉430070

【摘要】 利用传统紫外光曝光方式,通过扫描电镜观察了刻蚀后样品的表面形貌,定性地讨论前烘工艺对MEMS三维结构的影响。得到优化的工艺为:在对氧化后的硅片进行标准清洗,烘箱温度200℃活化表面30 min。涂胶旋转速度600 r/min,旋转15 s,曝光时间为17 s的条件下,最佳前烘温度为80℃,时间为30 min。研究结果为微器件的制造提供了一些可靠的工艺参数。

【Abstract】 This paper was the experimental research of photographic progress on BN-303 photo-resist,in which the ultraviolet light was used in exposure.The surface morphology was observed with SEM.It was discussed that the effect of soft-baking on 3D structure of MEMS,qualitatively.Finally,the optimized technical parameters obtained through experiments were as follows:Soft-baking time was 80 ℃ and soaking time was 30 min,under the condition of cleaning oxidized silicon mask with standard methods,activating sample surface for 30 min at drying temperature 200 ℃,coating photo-resist at 6 000 r/min of rotating speed for 15 s with 17 s of exposure time.The above research results might provide some reliable technical parameters for fabricating micro-device.

【关键词】 光刻BN-303光刻胶前烘显影
【Key words】 photo-graphyBN-303 photo-resistsoft-bakingdevelopment
【基金】 教育部科技重点项目(104136)
  • 【文献出处】 武汉理工大学学报 ,Journal of Wuhan University of Technology , 编辑部邮箱 ,2007年05期
  • 【分类号】TN405
  • 【被引频次】4
  • 【下载频次】548
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