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BN-303光刻胶前烘工艺对MEMS三维结构的影响
Effect of Soft-baking of BN-303 Photo-resist on 3D Structure of MEMS in Micro-fabrication
【摘要】 利用传统紫外光曝光方式,通过扫描电镜观察了刻蚀后样品的表面形貌,定性地讨论前烘工艺对MEMS三维结构的影响。得到优化的工艺为:在对氧化后的硅片进行标准清洗,烘箱温度200℃活化表面30 min。涂胶旋转速度600 r/min,旋转15 s,曝光时间为17 s的条件下,最佳前烘温度为80℃,时间为30 min。研究结果为微器件的制造提供了一些可靠的工艺参数。
【Abstract】 This paper was the experimental research of photographic progress on BN-303 photo-resist,in which the ultraviolet light was used in exposure.The surface morphology was observed with SEM.It was discussed that the effect of soft-baking on 3D structure of MEMS,qualitatively.Finally,the optimized technical parameters obtained through experiments were as follows:Soft-baking time was 80 ℃ and soaking time was 30 min,under the condition of cleaning oxidized silicon mask with standard methods,activating sample surface for 30 min at drying temperature 200 ℃,coating photo-resist at 6 000 r/min of rotating speed for 15 s with 17 s of exposure time.The above research results might provide some reliable technical parameters for fabricating micro-device.
【Key words】 photo-graphy; BN-303 photo-resist; soft-baking; development;
- 【文献出处】 武汉理工大学学报 ,Journal of Wuhan University of Technology , 编辑部邮箱 ,2007年05期
- 【分类号】TN405
- 【被引频次】4
- 【下载频次】548