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立方氮化硼薄膜制备与性质研究新进展
Recent Advances in Synthesis and Properties of Cubic Boron Nitride Films
【摘要】 立方氮化硼(c-BN)具有优异的物理和化学性质,在力学,光学和电子学等方面有着广泛的应用前景.自上世纪80年代开始,低压沉积c-BN薄膜的研究迅速发展,到90年代中期达到高潮,随后进展缓慢,c-BN薄膜研究转入低潮.近年来,c-BN薄膜研究在几方面取得了突破,如获得与衬底粘附良好、厚度超过1μm的c-BN厚膜;成功实现了c-BN单晶薄膜的异质外延生长;此外,在c-BN薄膜力学性质和过渡层微结构研究方面也取得了进展.本文主要评述最近几年c-BN薄膜研究在以上几方面取得的最新进展.
【Abstract】 Cubic boron nitride (c-BN) attracts widespread interest as a promising material for many potential applications because of its unique physical and chemical properties. Since the 1980’s the research in c-BN thin films has been carried out, which reached its summit in the mid of 1990’s, then turned into a downward period. In the past few years, however, important progress was achieved in synthesis and properties of cubic boron nitride films, such as obtaining >1μm thick c-BN films, epitaxial growth of single crystalline c-BN films, and advances in mechanics properties and microstructures of the interlayer of c-BN films. The present article reviews the current status of the synthesis and properties of c-BN thin films.
【Key words】 cubic boron nitride (c-BN) films; heteroepitaxy; stress; adhesion;
- 【文献出处】 无机材料学报 ,Journal of Inorganic Materials , 编辑部邮箱 ,2007年03期
- 【分类号】O484
- 【被引频次】14
- 【下载频次】788