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外电路在电磁脉冲对双极型晶体管作用过程中的影响

Influence of circuit during injection of EMP into bipolar junction transitor

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【作者】 陈曦杜正伟龚克

【Author】 CHEN Xi,DU Zheng-wei,GONG Ke (State Key Laboratory on Microwave and Digital Communications,Department of Electronic Engineering,Tsinghua University,Beijing 100084,China)

【机构】 清华大学电子工程系微波与数字通信技术国家重点实验室清华大学电子工程系微波与数字通信技术国家重点实验室 北京100084北京100084

【摘要】 借助自主开发的2维半导体器件-电路联合仿真器,研究了电磁脉冲从发射极注入双极型晶体管时,外电路的影响,分析了共基极接法晶体管的电流分配系数,然后在此基础上研究了3种典型外电路元件的影响。结果表明:当脉冲从发射极注入时,基极外接电阻对器件烧毁过程影响不大;集电极外接正电压源等效于削减电磁脉冲的幅度,有延缓器件烧毁的作用;集电极外接电阻能明显提高器件对电磁脉冲的耐受性。

【Abstract】 Bipolar junction transistors may be burned out by injected electromagnetic pulse.The circuits play important rolls because EMP is always coupled to circuit by antenna or aperture firstly and injected in BJT by circuit afterwards.The current distribution coefficient was studied,on the basis of which the influences of three kinds of typical components were studied with our 2-dimentional mixed-level circuit and device simulator.The conclusion is that a resistor at base has little influence on burnout process,a positive voltage source at collector has the effect of lowering the amplitude of EMP by the voltage of the source and a resistor at collector can significantly improve the durability of device against EMP.

【基金】 国家863计划项目资助课题
  • 【文献出处】 强激光与粒子束 ,High Power Laser and Particle Beams , 编辑部邮箱 ,2007年07期
  • 【分类号】TN322.8
  • 【被引频次】28
  • 【下载频次】190
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