【摘要】 提出了一种基于展开宽度可调的解压缩技术和X-压缩的多扫描电路的测试压缩方法。采用可变宽度的扫描链解压缩方法,对测试输入进行解压缩,且对于测试响应,结合了X-压缩的优点,测试响应整合器最小化故障被屏蔽的概率,扫描链的结构采取广播扫描模式。在此基础上对其改进,使其可同时处理取值相反的触发器。两种工作模式(串行模式和并行模式)可进一步处理剩余的紧凑的触发器值。提出的测试压缩算法的优点是:可节省测试设备的存储需求,减少测试输入输出引脚数和测试通道数,降低测试应用时间,从而全面提高测试激励数据和测试响应数据的压缩率。实验结果证明了该算法与以往算法相比较的优势。更多还原

【Abstract】 A complete test compression method based on adjustable width decompression and X-compact for multiple scan designs was presented.Test stimuli were decompressed using adjustable width scan chain decompression,and test response took in the merits of X-compact,a response shaper helped minimize the probability of fault mask,the extended broadcasting scan mode for scan chain was developed in order to deal with tests with opposing values,as well as identical values,either of the two types of modes,parallel mode or serial mode,helped to further reduce clock cycles while handling rest of the highly compact flip-flops,thus achieving fully compression for test data with reduced test application time,less test input/output pins coupled with test channels and storage requirement.Experimental results on benchmark ISCAS’89 demonstrated advantages of the proposed algorithm over previous algorithms.更多还原