【摘要】 本文通过密度演化法讨论了部件的寿命和修理时间都服从一般分布的由n个不同子系统串并联组成的可修系统的可靠性,为串并联系统的可靠性研究提供了理论依据.更多还原

【Abstract】 This paper is devoted to studying the reliability of the repairable series-parallel system which consists of Ndifferent subsystems.The life-span and repair time of the components are subject to general distributions.Density evolution method is used to solve the problem.And it provides theoretical foundation to the study of the reliability of repairable series-parallel system.更多还原