【摘要】 介绍了单粒子锁定现象的触发原理,探讨了针对典型CMOS器件SEL现象的主要特征和测试方法,并开展了几种CMOS器件的单粒子锁定试验研究。在模拟试验的基础上,研制成功抗单粒子锁定防护电路,能够自动探测和迅速解除单粒子锁定现象。更多还原

【Abstract】 This paper presents the string elements for Single Event Latchup,and discusses the major characters and test method for Single Event Latchup of CMOS devices.In the experiment of Latchup,we accomplish the Latchup test for several CMOS devices.On the basis of test,we develop the Latchup protection circuit successfully,which could automatically detect and promptly relieve the Latchup state.更多还原