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厚膜铂电阻浆料烧结过程微观结构分析
Microstructure Analysis of Thick Film Platinum Resistance Paste during Sintering
【摘要】 通过扫描电镜分析,研究了厚膜铂电阻浆料在烘干、烧结过程中微观结构的变化,讨论了烧结过程中对膜层致密度的影响因素。结果表明,烧结温度、烧结制度显著影响膜层微观结构,膜层中出现的针眼状孔洞主要是有机成分挥发、铂粉和玻璃体的拉聚收缩及冷却过程中基体对膜层拉附作用的综合结果。
【Abstract】 Changes of microstructure of the thick film platinum resistance paste during drying and sintering were studied by SEM.The main factors influencing tightness of the sintered membrane were discussed.The results indicated that the sintering temperature and schedule influence the microstructure of the sintered membrane significantly.The pinhole in the platinum film is attributed to the synthetical effects of the volatilization of organic component,the shrinkage of platinum and glass powder and the drawing force from the substrate during cooling procedure.
【关键词】 金属材料;
厚膜浆料;
铂;
烧结;
微观结构;
【Key words】 metal materials; thick film paste; platinum; sintering; microstructure;
【Key words】 metal materials; thick film paste; platinum; sintering; microstructure;
- 【文献出处】 贵金属 ,Precious Metals , 编辑部邮箱 ,2007年01期
- 【分类号】TF124.5
- 【被引频次】11
- 【下载频次】441