节点文献

厚膜铂电阻浆料烧结过程微观结构分析

Microstructure Analysis of Thick Film Platinum Resistance Paste during Sintering

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 贺昕陈峤熊晓东张曦南志军

【Author】 HE Xin,CHEN Qiao,XIONG Xiaodong,ZHANG Xi,NAN Zhijun(GRIKIN Advanced Materials Co.Ltd.,Beijing 100088,China)

【机构】 北京有色金属研究总院有研亿金新材料股份有限公司北京有色金属研究总院有研亿金新材料股份有限公司 北京100088北京100088

【摘要】 通过扫描电镜分析,研究了厚膜铂电阻浆料在烘干、烧结过程中微观结构的变化,讨论了烧结过程中对膜层致密度的影响因素。结果表明,烧结温度、烧结制度显著影响膜层微观结构,膜层中出现的针眼状孔洞主要是有机成分挥发、铂粉和玻璃体的拉聚收缩及冷却过程中基体对膜层拉附作用的综合结果。

【Abstract】 Changes of microstructure of the thick film platinum resistance paste during drying and sintering were studied by SEM.The main factors influencing tightness of the sintered membrane were discussed.The results indicated that the sintering temperature and schedule influence the microstructure of the sintered membrane significantly.The pinhole in the platinum film is attributed to the synthetical effects of the volatilization of organic component,the shrinkage of platinum and glass powder and the drawing force from the substrate during cooling procedure.

【关键词】 金属材料厚膜浆料烧结微观结构
【Key words】 metal materialsthick film pasteplatinumsinteringmicrostructure
  • 【分类号】TF124.5
  • 【被引频次】11
  • 【下载频次】441
节点文献中: 

本文链接的文献网络图示:

本文的引文网络