【摘要】 本文分析了嵌入式RAM的传统测试方法和内建自测试(BIST)方法,提出了一种新的BIST设计方案,该设计方案具有测试生成快,节约测试成本等优点。更多还原

【Abstract】 This essay introduces the general test method and BIST test method of embedded RAM and gives a new BIST design. This design has the advantages that could get test generation in short time and low test cost.更多还原