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拉伸工艺对PVDF薄膜形貌与结构的影响

Effects of stretching technology on morphology and structure of PVDF films

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【作者】 刘栋姜胜林仝金雨金学淼

【Author】 LIU Dong, JIANG Sheng-lin, TONG Jin-yu, JIN Xue-miao (Department of Electronic Science & Technology, Huazhong University of Science and Technology, Wuhan 430074, China)

【机构】 华中科技大学电子科学与技术系华中科技大学电子科学与技术系 湖北武汉430074湖北武汉430074

【摘要】 聚偏二氟乙烯(PVDF)薄膜中,β相的相对含量对其压电、铁电性能起决定性作用。利用单轴拉伸工艺制备了高β相的相对含量的PVDF薄膜,运用XRD、SEM和FT-IR等测试手段,分析了拉伸过程中PVDF薄膜形貌与结构的变化,重点讨论了不同拉伸比R对薄膜微观结构及β相的相对含量的影响。结果表明:PVDF薄膜中的α晶相受均匀外力作用转变成β晶相,在80℃下拉伸5倍时,薄膜中β相的相对含量可高达77%。

【Abstract】 In polyvinylidene fluoride (PVDF) films, the relative content of β phase had a crucial import on their piezoelectric and ferroelectric properties. PVDF films with high β phase relative content were prepared by uniaxial stretching. SEM, XRD and FT-IR were used to analyse the changes of the morphology and structure in PVDF films during the stretching process. And then effects of different stretching ratio R were discussed on the microstructure of films and the relative content of the β phase. As indicated by results, α phase in PVDF films is converted to β phase under constant external force, at 80 ℃, the relative content of β phase in films can be up to 77 % when the films are stretched 5 times.

【关键词】 有机高分子材料PVDF单轴拉伸β相
【Key words】 organic polymer materialPVDFuniaxial stretchingβ phase
【基金】 国家“973计划”资助项目(2004CB619300);新世纪优秀人才支持计划资助项目(NCET—04—0703)
  • 【文献出处】 电子元件与材料 ,Electronic Components and Materials , 编辑部邮箱 ,2007年03期
  • 【分类号】TM22
  • 【被引频次】23
  • 【下载频次】617
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