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单片集成的高性能压阻式三轴高g加速度计的设计、制造和测试

Design,Fabrication,and Characterization of a High-Performance Monolithic Triaxial Piezoresistive High-g Accelerometer

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【作者】 董培涛李昕欣张鲲吴学忠李圣怡封松林

【Author】 Dong Peitao1,2,Li Xinxin2,Zhang Kun2,Wu Xuezhong1,Li Shengyi1,and Feng Songlin2(1 College of Mechatronics Engineering and Automation,National University of Defense Technology,Changsha 410073,China)(2 State Key Laboratory of Transducer Technology,Shanghai Institute of Microsystem and Information Technology,Chinese Academy of Sciences,Shanghai 200050,China)

【机构】 国防科技大学机电工程与自动化学院中国科学院上海微系统与信息技术研究所传感技术国家重点实验室中国科学院上海微系统与信息技术研究所传感技术国家重点实验室 长沙410073 中国科学院上海微系统与信息技术研究所传感技术国家重点实验室上海200050长沙410073

【摘要】 设计、制造并测试了一种单片集成的压阻式高性能三轴高g加速度计,量程可达105g.x和y轴单元均采用一种带微梁的三梁-质量块结构,z轴单元采用三梁-双岛结构.与传统的单悬臂梁结构或者悬臂梁-质量块结构相比,这两种结构均同时具有高灵敏度和高谐振频率的优点.采用ANSYS软件进行了结构分析和优化设计.中间结构层主要制作工艺包括压阻集成工艺和双面DeepICP刻蚀,并与玻璃衬底阳极键合和上层盖板BCB键合形成可以塑封的三层结构,从而提高加速度计的可靠性.封装以后的加速度计采用落杆方法进行测试,三轴灵敏度分别为2.28,2.36和2.52μV/g,谐振频率分别为309,302和156kHz.利用东菱冲击试验台,采用比较校准法测得y轴和z轴加速度计的非线性度分别为1.4%和1.8%.

【Abstract】 A silicon machined high-performance monolithic triaxial piezoresistive accelerometer is developed for measurements on the order of 100,000g.A three-beam-mass scheme with tiny beams is developed for the x and y axial elements,and a three-beam-twin-mass structure is developed for the z axial element.Both of these structures feature high sensitivity and high resonance frequency compared with a conventional cantilever structure or cantilever-mass structure.ANSYS is used to analyze and optically design the accelerometer.The three sensing elements are monolithically integrated by micromachining techniques of double-sided deep etching combined with piezoresistive processes.The middle structure silicon layer is anodic bonded with glass substrate and BCB bonded with a top cap silicon layer for the purpose of plastic packaging to improve the reliability of the accelerometer.A dropping-bar system is used to characterize the accelerometer.The sensitivities in the x,y,and z axes are measured to be 2.28,2.36,and 2.52μV/g,respectively,while the corresponding resonant frequencies are 309,302,and 156kHz.Using a Dongling shock test machine,the nonlinearity is tested by comparison calibration and measured to be 1.4% and 1.8% for the y and z axial elements,respectively.

  • 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,2007年09期
  • 【分类号】TH824.4
  • 【被引频次】19
  • 【下载频次】481
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