节点文献

印刷碳纳米管薄膜场发射失效行为研究

Study on the Failure Behavior in Field Emission of Printed Carbon Nanotube Films

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 曾凡光朱长纯刘卫华刘兴辉

【Author】 ZENG Fan-guang,ZHU Chang-chun,LIU Wei-hua,LIU Xing-hui (School of Electronics and Information Engineering,Xi’an Jiaotong University,Xi’an 710049,China)

【机构】 西安交通大学电子与信息工程学院西安交通大学电子与信息工程学院 陕西西安710049陕西西安710049

【摘要】 对基于印刷碳纳米管(CNT)薄膜的场发射器件的失效行为进行了研究。微观分析结果表明,器件失效主要是由真空击穿对CNT和导电衬底造成损坏所引起的。印刷CNT薄膜中存在的CNT团聚颗粒所造成的正反馈的发热和电流增加导致了真空击穿的发生。通过在真空室中对印刷CNT薄膜进行场发射条件下的老炼处理,有效地预防了真空击穿的发生,并使薄膜的场发射均匀性得到提高,证实了真空老炼对预防真空击穿和提高器件工作可靠性的作用。

【Abstract】 The failure behavior of field emission devices based on printed carbon nanotube (CNT) films was investigated.Microscopic analysis results revealed that the failure behavior is mainly caused by the destruction of both carbon nanotubes and conductive substrate due to the vacuum breakdown,which resulted in the increased Joule heat and emission current due to the positive feedback field emission.By the ageing of the printed CNT films under field emission conditions in the Vacuum chamber,the vacuum breakdown was prevented effectively and the uniformity of field emission of the aged CNT film was improved.It indicates that ageing of the printed CNT films in the vacuum chamber is helpful for the prevention of vacuum breakdown and the improvement of reliability of devices during operating.

【基金】 国家自然科学基金重点项目(6003601060276037);国家863重点项目(2001AA313090);教育部博士点基金项目(20020698014)
  • 【文献出处】 真空电子技术 ,Vacuum Electronics , 编辑部邮箱 ,2006年01期
  • 【分类号】TN141
  • 【下载频次】106
节点文献中: 

本文链接的文献网络图示:

本文的引文网络