【摘要】 在IC产业链中,测试是必不可少的环节之一,而如何降低过高的测试成本也逐渐成为研究的热点。本文基于伺服环方法和权位点测试法提出了一种A/D转换器静态参数的低成本测试方法,并在自主开发的JC-3196A集成电路测试系统上实现。该方法具有普遍的适用性,对降低数模混合信号集成电路的测试成本具有重要意义。更多还原

【Abstract】 A new A/D converter test approach based on servo-loop method and weights output code test is shown to have several advantages of low-cost over the traditional histogram test method.The proposed scheme is a very useful solution to minimize the cost of A/D converter test,especially for high resolution A/D converters.Besides,the hardware and software design is to some extent universal and is easily to implement in other ATEs.更多还原