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基于CCD的单缝衍射条纹光强测量与小波去噪技术研究
Application of the Light’s Strength Measurement for Single Slot Diffraction Stripes Based on CCD Detection and Wavelet’s Denoise Technology
【摘要】 通过CCD的数据采集对单缝衍射条纹的光强进行测量试验,简要分析了试验中的噪声来源。提出使用小波技术对CCD的采集信号进行噪声滤除,详细讨论了小波的分解与重构以及在去除噪声中的应用。试验结果表明,小波技术能完全滤除噪声。
【Abstract】 The light’s intensity of single slot diffraction stripes is measured through the data acquisition of CCD detection,the source of noise in the experiment is briefly analyzed.The noise of CCD’s data is filtered with the wavelet technology which is setout in this paper.The decomposing and composing of wavelet and the application of it in denoising are particularly discussed.The result of experiment(indicates) that the noise can be filtered completely by the wavelet.
【关键词】 数据采集;
~+衍射条纹;
~+光强;
噪声源;
~+小波去噪;
【Key words】 Data acquisition Diffraction stripes Intensity of light Noise source Wavelet denoise;
【Key words】 Data acquisition Diffraction stripes Intensity of light Noise source Wavelet denoise;
【基金】 安徽省自然科学基金资助(项目编号:03042309)
- 【文献出处】 宇航计测技术 ,Journal of Astronautic Metrology and Measurement , 编辑部邮箱 ,2006年06期
- 【分类号】TN206
- 【被引频次】3
- 【下载频次】229