节点文献

循环间歇溅射工艺对PLT薄膜性能的影响

Effect of Circular Intermittent Deposition on the Morphologies,Microstructures and Properties of PLT Thin Films

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 孙明霞钟朝位张树人张万里陈祝郑泽渔

【Author】 SUN Ming-xia,ZHONG Chao-wei,ZHANG Shu-ren,ZHANG Wan-li,CHEN Zhu,ZHENG Ze-yu (School of Microelectronics and Solid State Electronics,University of Electronic Science and Technology,Chengdu 610054,China)

【机构】 电子科技大学微电子与固体电子学院电子科技大学微电子与固体电子学院 四川成都610054四川成都610054

【摘要】 采用射频磁控溅射技术利用循环间歇溅射工艺,在Pt/Ti/SiO2/Si基片上制备出了镧钛酸铅(PLT)薄膜。通过原子力显微镜、X-射线衍射仪分析了循环间歇溅射工艺对薄膜形貌、结构和铁电性能的影响。实验结果表明,相比于连续溅射工艺,循环间歇溅射工艺的基片温度较低,且制得的PLT薄膜晶粒细小、均匀,结构致密。薄膜具有纯钙钛矿型结构,循环次数从1次增加到3次,其(100)和(200)峰衍射强度逐渐增强,结晶性提高,铁电性能逐渐增强,其饱和极化强度由28μC/cm2增大到53μC/cm2,剩余极化强度由5μC/cm2增大到12μC/cm2。循环4次溅射后,薄膜的结晶性和铁电性开始下降。

【Abstract】 Pb0.88La0.12TiO3 thin films are fabricated by rf magnetron sputtering on SiO2/Si substrate.In this method,circle intermittent deposition is realized by periodical repetition of "deposition-nondeposition-annealing".With the aid of atom force microscopy(AFM) and Xray diffraction(XRD),the surface morphologies and crystallization of the films have been investigated.Compared with the films sputtered by continuous deposition,the surface of the films sputtered by circle intermittent deposition is more smooth and homogeneous.This kind of deposition also decreases the substrate temperature.It is shown that the films have good crystallization and a single perovskite phase.With the increasing of circle times from 1 to 3,the intensity of(100) and(200) orientation becomes stronger,the remnant polarization improved from 5 μC/cm2 to 12 μC/cm2 and the maximum polarization increased from 28 μC/cm2 to 53 μC/cm2.The crystallization and ferroelectrical properties of PLT films decreased after being deposited by 4 circle times.

  • 【文献出处】 压电与声光 ,Piezoelectrics & Acoustooptics , 编辑部邮箱 ,2006年01期
  • 【分类号】TM223
  • 【下载频次】63
节点文献中: 

本文链接的文献网络图示:

本文的引文网络