节点文献
热电元件性能测试系统的电路设计
Circuit Design for Significance Test System of Thermo Element
【摘要】 由于材料不稳定,热电元件须由测试系统完成性能筛选。介绍的热电元件测试系统用0.01 mm的激光小光斑,在4 mm2的元件表面进行400个点的扫描,将元件电信号输入计算机进行性能分析。该测试系统的第一个关键技术是:设计一个每步行程为0.005mm,扫描点距为0.1 mm的二维扫描平台小位移精密控制电路。另一方面,元件输出信号极为微弱,只有1~100μVpp,必须有高增益的放大电路,将输出信号放大到后端A/D电路所能接受的范围(0~10 V)内,并避免干扰造成信号失真,这是系统的另一关键技术。就上述2个技术问题作详细介绍和分析,成功地解决了上述问题,并经实际使用取得很好的效果。
【Abstract】 As for instable material,thermo elements have to significance filtration by test system.Here it is significance test system of thermo element which scan by laser facular in 0.01 mm on the surface of 4 square mm with 400 points.Then signal inputs computer for significance test.In the first place,the first key technology of the test system is to design little stepping exact control circuit with 2-demension scanning flat in 0.005mm every step,and in 0.1 mm scanning point.On the other hand,output signal of element is small with 1~100 vpp.It is necessary to have high gain amplifying circuit to amplify output signal to the scope between 0~10V,which A/D Circuit could be accepted,in order to avoid signal distortion by disturbance.The another key technology of the test system is mentioned above.Thesis described and analyzed in details about two technologies.And also,it is settled above questions,and achieved good effects in practical application.
- 【文献出处】 仪表技术与传感器 ,Instrument Technique and Sensor , 编辑部邮箱 ,2006年12期
- 【分类号】TN37
- 【被引频次】2
- 【下载频次】98