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高纯钯中痕量杂质的电感耦合等离子体质谱测定方法研究
Study on the Determination of Trace Impurities in High Purity Palladium by Inductively Couple Plasma-Mass Spectrometry
【摘要】 建立了高纯钯中16种痕量杂质的电感耦合等离子体质谱测定方法。考察了基体Pd的谱干扰和基体效应,采用Sc、Cs双内标补偿基体对待测信号的抑制。方法检出限为0.002μg/L~0.04μg/L,加标回收率为86%~114%,分析精密度为0.6%~3.9%。方法简便、快速、灵敏、准确。
【Abstract】 The method of inductively coupled plasma-mass spectrometry for the determination of impurities of 16 traceelements in highly pure palladium was studied.The spectral interference and matrix effect for palladinm on the method werediscussed.The matrix suppression effect of palladinm on signal could effectively be eliminated by using Sc,Cs as internalstandard.The determination limit is 0.002μg/L~0.04μg/L,the recovery rate of standand addition is 86 %~114 %,precisionis 0.6 %~3.9 %.This method is simple,rapid,sensitive and accurate.
【关键词】 电感耦合等离子体质谱法;
高纯钯;
痕量杂质;
内标;
【Key words】 Inductively coupled plasma-mass spectrometry; highly pure palladium; trace impurities; internal standard;
【Key words】 Inductively coupled plasma-mass spectrometry; highly pure palladium; trace impurities; internal standard;
- 【文献出处】 现代科学仪器 ,Modern Scientific Instruments , 编辑部邮箱 ,2006年06期
- 【分类号】O657.63;TG115.3
- 【被引频次】17
- 【下载频次】97