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沉积工艺条件对金刚石薄膜红外椭偏光学性质的影响
Effects of deposition conditions on infrared spectroscopic ellipsometry of CVD diamond films
【摘要】 采用红外椭圆偏振光谱仪对不同工艺条件下制备的CVD金刚石薄膜在红外波长范围内的光学参量进行了测量,分析了工艺条件对金刚石薄膜红外光学性质的影响.获得了最佳的沉积工艺参数,优化了薄膜的制备工艺.结果表明薄膜的折射率和消光系数与薄膜质量密切相关,当温度为750℃,碳源浓度为0·9%和压强为4·0kPa时,金刚石薄膜的红外椭偏光学性质最佳,折射率平均值为2·385,消光系数在10-4范围内,在红外波段具有良好的透过性.
【Abstract】 Diamond films deposited by hot filament chemical vapor deposition (HFCVD) under different deposition conditions are characterized using spectroscopic ellipsometric measurements in infrared region of 2.5—12.5 μm. Effects of deposition conditions on infrared spectroscopic ellipsometry of diamond films are investigated. The optical properties of diamond films depend strongls on its quality. The refractive index increases and the extinction coefficient decreases monotonicly with increasing sp~3 C content. High quality optical diamond films are obtained under reactor pressure of 4.0 kPa when substrate temperature and carbon concentration are 750 ℃ and 0.9%, respectively. Refractive index and extinction coefficient of diamond film of high transparency are 2.385 and of the order of 10~ -4 , respectively.
【Key words】 film optics; infrared optical properties; deposition conditions; diamond films;
- 【文献出处】 物理学报 ,Acta Physica Sinica , 编辑部邮箱 ,2006年10期
- 【分类号】O484.41
- 【被引频次】6
- 【下载频次】106