【摘要】 用X射线光电子能谱研究了Sm掺杂的固态C60相衍变和芯电子态.在SmxC60中Sm的含量x小于0.5时,样品是固溶相;在x=0.5和x=2.75之间的掺杂阶段,样品是这两个相的混合.在x=2.75和x=6之间的高掺杂阶段未观察到相分离的X射线光电子能谱证据.Sm4f,4d的实验数据表明Sm的价态是+2.二价Sm3d52芯态谱线存在两个子峰.更多还原

【Abstract】 Phases and core-levels of Sm-intercalated C 60 thin films are researched with X-ray photoemission spectroscopy. The solid solution phase dominates until the stoichiometry of Sm 0.5 C 60 . Below the intercalation level of Sm 2.75 C 60 , the sample is phase-separated into the solid solution phase and Sm 2.75 C 60 , while the sample is not the mixture of Sm 2.75 C 60 and Sm₆C 60 with the Sm concentration higher than Sm 2.75 C 60 . Experimental data of Sm 4f and 4d clearly reveal the valence state of Sm is divalent for Sm fullerides. Two subpeaks of divalent Sm 3d 5/2 level are found.更多还原