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影响磁性薄膜微波磁谱测量精度的因素
Factors Influencing Precision of Measurement for Determining the Spectral Complex Permeability of Thin Ferromagnetic Films
【摘要】 针对铁磁薄膜复磁导率在微波频段的测量,本文采用了一种利用短路微带线进行扫频的新方法。在介绍其测量过程的基础上,重点分析了待测薄膜电阻率、修正因子K及系统校准等因素对测量的影响,并对应提出了减小误差的解决方法,从而提高了测量的精度。
【Abstract】 In the present paper,a new method for determining the complex permeability of thin magnetic films is adopted.The measurement technique was carried out by a one-port permeameter,which is based on a short-circuited microstrip and frequency sweep.After introducing the measurement process,we chiefly show that the frequency-dependent permeability is affected by the electrical resistivity of the ferromagnetic layer,correct factor K as well as system calibration procedure and so on,and present the methods of reducing errors that have resulted from these factors,to help to improve the precision of the measurement.
【Key words】 Complex permeability; Ferromagnetic film; Microstrip technique; Electrical resistivity; System calibration;
- 【文献出处】 微波学报 ,Journal of Microwaves , 编辑部邮箱 ,2006年05期
- 【分类号】TM936
- 【被引频次】8
- 【下载频次】162