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电荷耦合器件型折射率测定仪的研制
Development of Apparatus with a Linear Charge-Coupled Device Array to Measure Refractive Index
【摘要】 基于折射定律设计光路,利用线阵电荷耦合器件(CCD)对光斑位移进行检测,研制成功小型的能够测量透明介质折射率的仪器,设计的测量折射率的范围显著增加.介绍了该仪器设计的基本原理、使用方法,并通过对一些材料折射率的测量,证明其具有较高的测量准确性.
【Abstract】 Using the linear charge-coupled device(CCD) array to measure the displacement of the refractive ray spot on the basis of the refraction law,we have designed a pint-sized apparatus to measure the refractive index of some transparent material.The designed measurable range of the refractive index is improved greatly.The designing principle and usage of the apparatus are explained in this paper.Measurement of the refractive index of some materials shows that the apparatus is of high measuring accuracy.
【关键词】 折射率;
线阵电荷耦合器件;
位移测量;
【Key words】 refractive index; linear charge-coupled array; displacement measure;
【Key words】 refractive index; linear charge-coupled array; displacement measure;
【基金】 同济大学国家工科物理教学基地资助项目
- 【文献出处】 同济大学学报(自然科学版) ,Journal of Tongji University(Natural Science) , 编辑部邮箱 ,2006年07期
- 【分类号】TH74
- 【被引频次】1
- 【下载频次】47