【摘要】 对惯性约束聚变的一种重要诊断方法———Kirkpatrick-Baez型结构显微镜成像方法进行了研究。计算了Kirkpatrick-Baez型结构显微镜的主要像差,并分析得出:造成轴上点像差的主要因素是球差,占像差的94%。基于光线追迹方法模拟出这种结构的成像过程,比较了不同反射镜长随视场变化对物面分辨率的影响,发现为了保证物面的空间分辨率能达到ICF研究要求视场应尽量控制在200μm以内。最终得出能量在8 keV、视场为200μm,分辨率小于10μm的Kirkpatrick-Baez型结构的模型。提出在装调过程中重要公差计算方法,得到数值孔径为0.003 7时,角度装调公差应在-0.087°~0.067°范围内。更多还原

【Abstract】 An important diagnosis methodKirkpatrick-Baez microscope system in ICF experiments was researched.The brief aberration of the Kirkpatrick-Baez microscope was calculated.The main aberration,spherical aberration was analyzed,and the spherical aberration is 94% of the total aberration.The configuration was simulated by the ray tracing method.Resolutions in different fields and mirror-lengths were compared.The modal of Kirkpatrick-Baez microscope was made in computer with 10 μm resolutionat 8 keV.It was studied about the adjusting tolerance method of Kirkpatrick-Baez microscope.When numerical aperture is 0.003 7,the angle error range is-0.087°~0.067°.更多还原