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电沉积法制备纳米SnO2薄膜

Preparation of Nano-SnO2 Thin Film by Electrodeposition

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【作者】 熊利芝何则强麻明友肖卓炳吴显明黄可龙

【Author】 XIONG Li-zhi~1,HE Ze-qiang~(1,2),MA Ming-you~1,XIAO Zhuo-bing~1,WU Xian-ming~1,HUANG Ke-long~2(1.College of Chemistry and Chemical Engineering,Jishou University,Jishou 416000,Hunan,China;2.College of Chemistry and Chemical Engineering,Central South University,Changsha 410083,Hunan,China)

【机构】 吉首大学化学化工学院中南大学化学化工学院 湖南吉首416000湖南吉首416000中南大学化学化工学院湖南长沙410083

【摘要】 采用一种电沉积法室温下制备纳米SnO2薄膜。经研究得到了电沉积SnO2薄膜的最佳工艺条件:电流密度、电沉积时间、主盐浓度、游离酸浓度分别为i=8 mA.cm-2,t=120 m in,c(SnC l2)=0.02 mol/L,c(HNO3)=0.03 mol/L。用X射线衍射、红外光谱和扫描电镜、透射电镜等对薄膜的物相和微观结构、表面形貌等进行了研究。结果表明,室温下干燥得到的薄膜由SnO2.xH2O组成,但经过400℃热处理后,逐渐转变成结晶较为完整的四方结构SnO2薄膜,薄膜的表面较为平整、呈多孔状,薄膜粒径大小为8~20 nm。

【Abstract】 A process for preparing tin oxide thin films directly on copper foil by electrodeposition was developed.The optimal preparation technology to obtain SnO2 thin films was proposed as current density i=8 mA·cm2,time of deposition t=120 min,c(SnCl2)=0.02 mol/L and c(HNO3)=0.03 mol/L.The phase identification,microstructure and morphology of the thin films were investigated by XRD,FTIR,SEM and TEM.The as-deposited thin film composed of SnO2·xH2O was formed on drying at room temperature.Nanocrystalline SnO2 thin film having tetragonal structure with average grain size in the range of 8 to 20 nm and uniform porous surface was obtained by heat-treating the as-deposited film at 400 ℃ for 2 h.

【关键词】 SnO2薄膜电沉积微观结构
【Key words】 tin oxidethin filmelectrodepositionmicrostructure
【基金】 国家自然科学基金(20376086);湖南省教育厅优秀青年项目(04B016);中国博士后科学基金资助项目(2005037700);中南大学博士后科学基金资助项目(2004107)~~
  • 【分类号】TN304.21
  • 【被引频次】10
  • 【下载频次】547
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