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铝表面SiO_X薄膜结合性能与机理研究

Bending test and bonding mechanism analysis of the SiO_X film on aluminum substrate

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【作者】 张际亮郦剑沃银花王幼文甘正浩

【Author】 ZHANG Ji-liang1, LI Jian1, WO Yin-hua1, WANG You-wen1, GAN Zheng-hao2(1. Material Science and Engineering Department of Zhejiang University, Hangzhou 310027,China; 2. Electrical and Electronic Engineering Department of Nanyang Technological University, Singapore 639798)

【机构】 浙江大学材料系新加坡南洋理工大学电气工程系 浙江杭州310027浙江杭州310027新加坡639798

【摘要】 应用化学气相沉积(CVD)方法在铝表面形成SiOX陶瓷涂层,通过弯曲实验研究了涂层与基体的结合性能。利用扫描电子显微镜(SEM)观察了弯曲部位的表面形貌,弯曲过程表述为表面凹坑与内部孔洞联合长大,形成长条裂纹状沟槽或突脊,最后裂纹长大直至断裂。研究表明,基底与膜层结合良好,形成高结合力的原因是铝基底与表面SiO膜层间过渡层中的AlO与SiO键合能很高,键合稳定。

【Abstract】 A kind of SiO_X film was deposited on aluminum substrate by ambient pressure chemical vapor deposition. The bonding properties were studied by 90 and 180 degrees multi-bending tests. The morphology of the bended surface by scanning electrical microscopy shows that the film is bonded well to the substrate. The fracture process is described as follows: the surface pits and inner vacancies grow and link up to a lot of grooves or ridges,causing breaking down. The results show that there is transition layer in which the bonding energy of Al-O and Si-O is high enough to binding the substrate and surface showing an excellent bonding strength.

【关键词】 铝基SiOX薄膜弯曲实验结合力机理
【Key words】 aluminumSiO_X filmmulti-bending testbonding propertiesmechanism
【基金】 国家自然科学基金项目(50271065)
  • 【文献出处】 材料热处理学报 ,Transactions of Materials and Heat Treatment , 编辑部邮箱 ,2006年01期
  • 【分类号】TG174.44
  • 【被引频次】4
  • 【下载频次】112
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