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微器件表面3D形貌的新型微/纳米探头测量系统

An Innovative Micro/nano Probe Measurement System for 3D Profile of Microcomponent

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【作者】 陈叶金范光照刘玉圣

【Author】 CHEN Ye-jin~1,FAN Kuang-chao~(1,2),LIU Yu-sheng~1(1.Hefei University of Technology,Hefei,Anhui 230009,China;2.Department of Mechanical Engineering,Taiwan University,Taipei,Taiwan 106,China)

【机构】 合肥工业大学仪器仪表学院合肥工业大学仪器仪表学院 安徽合肥230009安徽合肥230009台湾大学机械工程学系台湾台北106

【摘要】 采用DVD光碟机的激光读取头,开发出微器件表面3D形貌的新型微/纳米测量系统。分析了激光读取头内部结构与运作原理,当反射面不在聚焦位置时,经四象限传感器探测聚焦误差信号(FES),驱动音圈马达以带动物镜重回聚焦位置,完成自动聚焦过程。并对音圈马达具有的磁滞现象加以研究,应用Preisach磁滞模型补偿磁滞误差,进而提高激光读取头在测量方面的精确度。结合HP激光干涉仪对测头不同测量范围的标准差与重复性进行校正测量,由校正的结果分析,此测头系统可实现微器件表面3D形貌的微/纳米测量。

【Abstract】 The DVD pickup head is adopted to develop an innovative micro/nano-measuring system for the 3D surface figures of microcomponent.The structure and operational theory of probe are analyzed,when the reflective plane away from the focus position,the focus error signal(FES) can be detected by a four-quadrant photodiode.The voice coil motor(VCM) took back the objective lens to the focus position for achieving auto-focusing by FES.The hysteresis in VCM is studied,and the hysteresis error is compensated with Preisach model,so the system can improve the measurement accuracy.By combining with the HP laser interferometer,the standard error and repeatability of probe is calibrated in different measurement ranges.From these calibration results,the probe is adaptive to achieve micro/nano measurment for the 3D profile of microcomponent.

【基金】 国家自然科学基金(50275048)
  • 【文献出处】 计量学报 ,Acta Metrologica Sinica , 编辑部邮箱 ,2006年01期
  • 【分类号】TH703
  • 【被引频次】15
  • 【下载频次】292
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