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含负折射率介质布拉格微腔的缺陷模

Defect Mode of Bragg Microcavity Containing Negative Refractive Index Materials

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【作者】 蒋美萍; 陈光; 陈宪锋; 沈小明; 王旭东; 是度芳;

【Author】 JIANG Mei-ping~(1,2),CHEN Guang~1,CHEN Xian-feng~2,SHEN Xiao-ming~2,WANG Xu-dong~2,SHI Du-fang~(2,3)~1Department of Materials Science and Engineering,Nanjing Universityof Science and Technology,Nanjing,Jiangsu 210094,China~2Department of Information Science,Jiangsu Polytechnic University,Changzhou,Jiangsu 213016,China~3Department of Physics,Huazhong University of Science and Technology,Wuhan,Hubei 430074,China

【机构】 南京理工大学材料科学与工程系; 江苏工业学院信息科学系; 江苏工业学院信息科学系 江苏南京210094江苏工业学院信息科学系; 江苏常州213016; 江苏南京210094; 江苏常州213016华中科技大学物理系; 湖北武汉430074;

【摘要】 研究了由正和负两种折射率介质交替排列构成的一维光子晶体布拉格微腔的透射谱和缺陷模性质,并将传输矩阵各矩阵元在中心频率附近采用泰勒展开并取一级近似,得到了中心频率附近缺陷模的透射率公式和品质因子公式。研究结果表明:一级近似法能很好地解释由于缺陷层厚度变化而引起的中心频率附近缺陷模频率变化的规律,缺陷模品质因子公式与数值计算结果十分吻合;处于中心频率处的缺陷模具有较高的品质因子,增大缺陷层厚度和布拉格镜周期数可提高缺陷模的品质因子。

【Abstract】 The transmission spectra and defect mode properties of the one-dimensional(1D) photonic crystal with Bragg microcavity are studied,where the Bragg reflectors are composed of alternately arranged different dielectrics with positive and negative indices.The transfer matrix is expanded in Taylor series near the central frequency,and the formulae of transmission and the quality factor are obtained with the first order approximation.Frequency variance of the defect mode near the central frequency caused by change of the thickness of defect layer material(DLM) can be well explained with the method of the first order approximation.The formula of the quality factor is almost identical with the result of numerical calculation.The quality factor at the central frequency is higher,and increasing defect layer thickness and the number of period can enhance the quality factor of the defect mode.

  • 【文献出处】 中国激光 ,Chinese Journal of Lasers , 编辑部邮箱 ,2006年08期
  • 【分类号】O436
  • 【被引频次】4
  • 【下载频次】128
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