节点文献
一种测量微波高Q谐振腔品质因数的新方法
A New Method for Measuring Quality Factor of a High-Q Cavity Resonator
【摘要】 传统的谐振腔品质因数扫频测量方法在实际测量时存在一定的限制。为此,针对微波高Q谐振腔,给出了一种测量其品质因数的新方法,该方法可以根据实测的谐振曲线灵活选取测量点,有效解决了传统方法中由于谐振腔受外电路影响导致测量误差较大的问题。采用该方法对一个微波高Q谐振腔进行测量,得到了较好的结果。
【Abstract】 The conventional swept frequency method for measuring quality factor of a cavity resonator is limited in practical use.Therefore,based on microwave high-Q cavity resonator,a new technique of calculating the quality factor through theoretical derivation is presented,which allows flexibility in choice of measurement point.This method solves the problem of coupling system influence,which can cause larger error in measuring.When it is applied to a microwave high-Q cavity resonator,this approach provides better results.
【关键词】 品质因数;
谐振腔;
微波测量;
半功率带宽;
【Key words】 quality factor; cavity resonator; microwave measurement; bandwidth of half power;
【Key words】 quality factor; cavity resonator; microwave measurement; bandwidth of half power;
- 【文献出处】 测控技术 ,Measurement & Control Technology , 编辑部邮箱 ,2006年12期
- 【分类号】TN629.1
- 【被引频次】14
- 【下载频次】473