【摘要】 采用射频磁控溅射法在玻璃基片上制备了Nd(Tb,Dy)Co/Cr薄膜.X射线衍射仪分析结果表明溅射制得的Nd(Tb,Dy)Co薄膜为非晶结构.振动样品磁强计(VSM)测试结果显示NdTbCo薄膜垂直膜面方向矫顽力与剩磁矩形比分别达到308.8kA/m和0.732,而平行膜面方向矫顽力与剩磁矩形比分别仅为22.3kA/m和0.173,这表明NdTbCo薄膜具有垂直磁各向异性.随着Nd掺杂量的增加,Nd(Tb,Dy)Co薄膜的矫顽力逐渐降低,克尔旋转角与反射率则逐渐升高.(NdxTb1-x)31Co69的克尔旋转角和反射率分别从x=0的0.2720°,0.2616,上升到x=0.338的0.3258°,0.3320.(NdxDy1-x)33Co67的克尔旋转角和反射率分别从x=0.210的0.2761°,0.3054,上升到了x=0.321的0.3231°,0.3974.Nd掺杂量对克尔旋转角的影响可用Nd(Tb,Dy)Co的亚铁磁结构进行解释.更多还原

【Abstract】 Thin films of Nd(Tb,Dy)Co/Cr were prepared onto glass substrate by RF magnetron sputtering and amorphous shown by X-ray diffraction (XRD). The results from vibrating sample magnetometer(VSM) measurement revealed that NdTbCo thin films had perpendicular magnetic anisotropy. The perpendicular coercivity and remanence square ratio reached 308.8kA/m and 0.732 respectively, and the inplanar coercivity and remanence square ratio were only 22.3kA/m and 0.173 respectively. With the addition of Nd, the coercivity decreased gradually, while kerr rotation angle and reflectivity increased step by step. When x increased from 0 to 0.338, kerr rotation angle and reflectivity of (Nd_xTb_ 1-x)_ 31Co_ 69 thin films increased from 0.2720°, 0.2616 to 0.3258°, 0.3320 respectively. When x increased from 0.210 to 0.321, kerr rotation angle and reflectivity of (Nd_xDy_ 1-x)_ 33Co_ 67 thin films increased from 0.2761°, 0.3054 to 0.3231°, 0.3974 respectively. The effect of Nd addition on kerr rotation angle was explained by the ferrimagnetic structure of Nd(Tb,Dy)Co.更多还原