【摘要】 由于X射线吸收谱中的总电子产额(TEY)和荧光产额(FLY)具有不同的取样探测深度,分别对样品的表面和体内敏感,因而两者的综合应用为纳米材料的整体分析提供了有力的依据,是透射电子显微镜(TEM)、X射线衍射(XRD)等传统方法分析纳米材料时的补充。同时,通过对TEY和FLY记录的X射线吸收谱的评述,作者认为X射线吸收谱可以准确、可靠地用来进行纳米线和纳米管的生长及其机理、取向、化学键合、缺陷与螺旋性等方面的研究。因此X射线吸收谱具有传统方法无法比拟的优势,是纳米材料研究领域强有力的表征工具。更多还原

【Abstract】 Due to the different sampling depth, the total electron yield (TEY) is sensitive to the surface and near surface region, while the fluorescence yield (FLY) probes the information of the bulk. Thus the combined use of TEY and FLY provides a powerful evidence for identifying the whole sample whether or not it is a nanoscale material, and is a supplement of the conventional methods for characterizing nanoscale materials, such as TEM and XRD. With analyses of X-ray absorption spectra recorded in TEY and FLY mode, it could be used for studying the mechanism of growth, orientation, chemical bonding, defect and helicity of nanowires and nanotubes exactly and reliably. Therefore, it is believed that X-ray absorption spectroscopy is a powerful characterization tool for the study of nanoscale materials, which has some super advantages over conventional methods.更多还原