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注入剂量对300℃下Mn~+注入p型GaN薄膜的结构和磁性影响
The effects of implanting dose on the magnetism and structure of Mn~+ implanted p-GaN films at 300℃
【摘要】 在(0001)面的蓝宝石衬底上用低压MOCVD法生长p型GaN外延层。对p型GaN薄膜用180keV的Mn+离子注入进行磁性粒子掺杂,注入时GaN薄膜处于300℃,注入剂量分别为5.0×1015、1.0×1016和5.0×1016cm-2。对注入的样品在N2气流中进行快速热退火处理,温度为850℃,时间为30s。用超导量子干涉仪(SQUID)对样品的磁性进行了分析,在5.0×1015cm-2的注入样品中发现了较强的铁磁性;而1.0×1016和5.0×1016cm-2的Mn+离子注入样品中铁磁响应有所减弱。结合用X射线衍射(XRD)和扫描电子显微镜(SEM)对在不同剂量下Mn+注入GaN薄膜的结构、形貌和成分的分析,揭示了不同剂量磁性离子注入给GaN薄膜带来的结构、形貌和相应的铁磁性变化规律,发现只有适当的注入剂量(5.0×1015cm-2)才有利于在300℃下用180keV的Mn+注入对p型GaN薄膜进行磁性离子掺杂。
【Abstract】 Wurtzite p-type GaN epilayer,which has a thickness of 0.5mm,is prepared by MOCVD on GaN buffer with sapphire substrate.Magnetic doping of the p-type GaN film is achieved by 180keV Mn+ ions implantation.During the implantation,the GaN films are all kept at 300℃.The implanting dosages are 5.0×1015,1.0×1016 and(5.0)×1016cm-2,respectively.After an annealing step at 850℃ for 30s in flowing N2,the magnetism of the Mn+ implanted GaN films is investigated by superconducting quantum interference device(SQUID).In the p-GaN film with 5.0×1015cm-2 Mn+-implantation,obvious ferromagnetism is found with hysteresis loop.While with the increase of implanting doses,the ferromagnetism weakens for the samples with 1.0×1016 and(5.0)×1016cm-2 Mn+-implantation.Combined with the structural characteristics studied by X-ray diffraction(XRD) and the morphology and constituent information revealed by scanning electron microscopy(SEM),one discloses the relations between the implanting doses and the structure and magnetism of Mn+ implanted p-GaN films.Only suitable implanting dose(5.0×1015cm-2) is beneficial to the recovery of implanting defects and the generation of ferromagnetism in the 180keV Mn+ implanted p-GaN films at 300℃.
- 【文献出处】 功能材料 ,Journal of Functional Materials , 编辑部邮箱 ,2006年09期
- 【分类号】O484
- 【被引频次】1
- 【下载频次】92