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微带法测试薄膜0.5~5G磁导率

A broad-band measurement for determining the complex permeability of thin films using microstrip line method

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【作者】 彭显旭江建军张秀成何华辉

【Author】 PENG Xian-xu,JIANG Jian-jun,ZHANG Xiu-cheng,HE Hua-hui (Dept.of Electronic Sci.& Tech.,Huazhong University of Science and Technology,Wuhan 430074,China)

【机构】 华中科技大学电子科学与技术系华中科技大学电子科学与技术系 湖北武汉430074湖北武汉430074

【摘要】 提出了可以在0.5~5GHz频带扫频测量磁性薄膜复磁导率rμ的微带线法,推导出了由倒置短路微带线单端口网络的反射系数R(S11)表示rμ的理论公式。对微带线夹具进行了设计,并结合虚拟仪器技术,以LabVIEW为软件平台建立了一套测量薄膜微波复磁导率的自动测量系统。给出了FeCo基磁性纳米颗粒膜的磁导率测试曲线,表明微带法具有准确性较高、既适宜于面内各向异性薄膜又适合于各向同性薄膜的测量和容易操作等优点。

【Abstract】 A microstrip line method for making broad-band(0.5~5GHz)and frequency-sweep measurement on complex permeability of thin magnetic films is presented.The theoretical formulas,in which S11 is expressed as the function of μr for short-circuited and inverted microstrip line network,are derived.A sample of the microstrip line holder is designed.An automatic measurement system of virtual instrumentation,is developed for measuring complex permeability of nano-magnetic thin films materials under microwave frequency.Measured curves for μr of FeCo-based nano-magnetic thin granule films material are given.The measurement results demonstrate that the method proposed is of high accuracy and easy operation.

  • 【文献出处】 功能材料 ,Journal of Functional Materials , 编辑部邮箱 ,2006年02期
  • 【分类号】TM936.4
  • 【被引频次】17
  • 【下载频次】289
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