【摘要】 为降低线阵CCD拼接测量难度,提出改进的多光学系统线阵CCD拼接测量法。根据检测幅宽和精度要求,将较宽的被测幅面分成若干区域。各区域放置独立可调的光学成像系统及线阵CCD。调整各光学系统,使总成像范围覆盖整个被测幅面。几个线阵CCD同步驱动并行采集。图像信号通过PCI高速数据采集系统送入计算机。为提高判别速度,采用多尺度灰度形态学方法实现快速图像增强和缺陷判别,每秒钟可处理20幅2048像素200像素的8bit灰度图像。实验表明,可实现8个线阵CCD拼接检测幅面宽1.2m彩色感光胶片的表面质量,检测速度最高可达90m/min,可识别直径在0.1mm以上的缺陷,准确率在96%以上。更多还原

【Abstract】 An improved multi-optical imaging systems linear CCDs inspection method is proposed inorder to reduce the difficulty of previous linear CCDs mosaic inspection. According to the width andaccuracy of inspection, the wide detected area is divided into several segments. In each segment a set ofadjustable imaging system and linear CCD is arranged. These systems are adjusted properly so that thewhole frame area are detected. These CCDs are driven synchronously and parallelly. The image signalsare sent to computer system by PCI high-speed data collecting system. In order to raise the speed ofdefect discrimination, a multi-scale structure gray-morphological algorithm is applied to enhance andrecognize the defect images. 20 images of 8 bit 2048 200 pixels can be processed by this algorithm.Experiments show that 8 linear CCDs can be assembled to inspect the surface of wide-frame color film1.2 m wide. This system can run in high speed of 90m/min at maximum. A defect with a diameter over0.1mm can be detected. The detection accuracy can be up to 96%.更多还原