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热–机械应力和湿气引起QFN器件层间开裂分析
Analysis on Thermal-mechanical Stress and Moisture Driven Delamination in the QFN Package Devices
【摘要】 采用通用有限元软件分析和计算器件在潮湿环境下的潮湿扩散,并计算由于吸潮使器件在无铅回流的高温下产生蒸汽压力,并对层间开裂现象进行分析。结果表明,气压是层间开裂的主要原因,在气压和热机械应力的作用下,层合面上的微孔洞扩张并结合起来,导致器件最后失效。
【Abstract】 The finite element analysis on moisture diffusion in microelectronic plastic packages during moisture precondition by using a commercial FEA software was studied and modeled.Then,the vapor stress which induced under lead-free reflow temperature was calculated.And delamination phenomenon appear in package was also analyzed.The results indicate that the vapor pressure is a major driven force for interface delamination.Under vapor and thermo-mechanical stress,the micro holes in the interface start to expand and combine.Finally,it induced delamination.
【关键词】 电子技术;
QFN封装;
潮湿扩散;
无铅焊;
气压;
层间开裂;
【Key words】 electronic technology; QFN packages; moisture diffusion; lead-free reflow; vapor stress; delamination;
【Key words】 electronic technology; QFN packages; moisture diffusion; lead-free reflow; vapor stress; delamination;
【基金】 国家自然科学基金资助项目(60166001)
- 【文献出处】 电子元件与材料 ,Electronic Components and Materials , 编辑部邮箱 ,2006年06期
- 【分类号】TN405
- 【被引频次】11
- 【下载频次】238