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基于Nios Ⅱ的Serial EEPROM测试方法研究
Testing Serial EEPROM based on Nios Ⅱ
【摘要】 文章介绍了Serial EEPROM的测试原理,提出了一种基于Nios Ⅱ软核CPU测试Serial EEPROM 的方法,该方法具有稳定性高、所需器件少、可编程、低成本等优点。在Serial EEPROM的大量测试中可以代替昂贵的测试系统,是一种性价比较高的替代测试方案。
【Abstract】 A test method about serial EEPROM is described. It’s advanced to test EEPROM based on Nios Ⅱ soft CPU core, The advantages, of this mothod are high reliability, less components required, programmable and low cost. It is an alternative test solution with high value/cost ratio which can be used to replace expensive test system on Serial EEPROM mass test.
【关键词】 Serial EEPROM;
测试;
Nios Ⅱ;
CPU软核;
编程;
【Key words】 Serial EEPROM; Test; Nios Ⅱ; CPU Soft Core, Program;
【Key words】 Serial EEPROM; Test; Nios Ⅱ; CPU Soft Core, Program;
- 【文献出处】 电子与封装 ,Electronics & Packaging , 编辑部邮箱 ,2006年05期
- 【分类号】TP333
- 【下载频次】72