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半导体封装测试厂库存控制系统的研究

The Study of WIP Control System in Semiconductor Assembly and Test Factory

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【作者】 李茂王安麟

【Author】 Li Mao, Wang An-lin (School of Mechanical & Power Engineering, Shanghai Jiaotong University, Shanghai 200030, China;Intel Product (Shanghai ) LTD, Shanghai 200131, China )

【机构】 上海交通大学机械与动力工程学院上海交通大学机械与动力工程学院 上海 200030 英特尔产品(上海)有限公司上海 200131上海 200030

【摘要】 在制品库存控制是生产制造系统的一项重要活动,它直接关系到工厂的产出、生产周期和物料投放。当前很多半导体封装测试厂还没有形成一个系统化的库存管理模式,导致库存过高或不均, 直接影响产出和生产成本。文章将阐述半导体封装测试厂如何选用并有效实施CONWIP系统,以及它在生产控制、降低库存和缩短生产周期上发挥的积极作用。

【Abstract】 Production WIP inventory control is an essential problem to manufacturing system. It is directly related to the factory throughput, cycle time and decision of when to release material into the shop floor. A systematic WIP inventory control model has not been established in many semiconductor assembly and test factorys. This often leads to excessive or unbalanced WIP on production line and eventually impacts the output and manufacturing cost. This paper illustrates how CONWIP systems was adopted and implemented in a semiconductor assembly and test factory, What is the positive impact it brings to the factory with regard to shop floor control, WIP inventory and cycle time reduction.

  • 【文献出处】 电子与封装 ,Electronics & Packaging , 编辑部邮箱 ,2006年05期
  • 【分类号】TN305.94;TP273
  • 【被引频次】9
  • 【下载频次】168
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